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By IEEE Lasers & Electro-Optics Society

ISBN-10: 1559374004

ISBN-13: 9781559374002

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All rights reserved. 09-1999 Test duties 6 and 7 are not required if test duties 4 and 5 are made on a single-phase basis. 5 Test duties 8 and 9 Test duties 8 and 9 in Table 1 are single-phase tests made at 58% of the maximum rated voltage. These tests are intended to demonstrate the short-line fault capability of the circuit breaker. 04-1999. 5 × I for 50 Hz. The test may be performed as part of test duty 4 or its alternates. The latching portion of the test is demonstrated by sustaining the current flow after the closing operation for a duration equivalent to at least 10 cycles of the rated power frequency.

04-1999). j) If tests are made with lumped capacitor banks to simulate transmission lines or cables, the test circuit may be modified to limit current surges on closing to those obtained when closing into the surge impedance of a line or cable. k) For circuit breakers equipped with shunting resistors, the thermal capability of the resistors must be considered in determining the time interval between tests. 1 Method of demonstration by measurement of overvoltages The ability of a circuit breaker design to meet its rated transient overvoltage factor shall be demonstrated by making the required series of capacitance current switching tests on an essentially lossless circuit (no resistance intentionally added).

All rights reserved. 4 Synthetic tests Tests to demonstrate the ability of a circuit breaker to switch capacitance currents may be made where the recovery voltage across the circuit breaker and the current through the circuit breaker are supplied from different parts of the same circuit. This is usually referred to as a synthetic circuit. With such a circuit it is generally possible to simulate a given kvar switching operation with a significantly smaller actual capacitive load. The adequacy of a test by synthetic methods depends, among other things, on the relative timing and shape of the recovery voltage with respect to the interruption of the current through the test circuit breaker.

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1995 IEEE Conference on Lasers and Electro-Optics by IEEE Lasers & Electro-Optics Society

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